Low-Frequency Noise In Advanced Mos Devices
Haartman, Martin von.
Low-Frequency Noise In Advanced Mos Devices [electronic resource] / by Martin von Haartman, Mikael Östling. - XVI, 216 p. online resource. - Analog Circuits and Signal Processing Series . - Analog Circuits and Signal Processing Series .
Low-Frequency Noise in Advanced CMOS Devices begins with an introduction to noise, describing the fundamental noise sources and basic circuit analysis. The characterization of low-frequency noise is discussed in detail and useful practical advice is given. The various theoretical and compact low-frequency (1/f) noise models in MOS transistors are treated extensively providing an in-depth understanding of the low-frequency noise mechanisms and the potential sources of the noise in MOS transistors. Advanced CMOS technology including nanometer scaled devices, strained Si, SiGe, SOI, high-k gate dielectrics, multiple gates and metal gates are discussed from a low-frequency noise point of view. Some of the most recent publications and conference presentations are included in order to give the very latest view on the topics. The book ends with an introduction to noise in analog/RF circuits and describes how the low-frequency noise can affect these circuits.
9781402059100
10.1007/978-1-4020-5910-0 doi
Engineering.
Microwaves.
Electronics.
Systems engineering.
Engineering.
Electronics and Microelectronics, Instrumentation.
Circuits and Systems.
Physics and Applied Physics in Engineering.
Microwaves, RF and Optical Engineering.
TK7800-8360 TK7874-7874.9
621.381
Low-Frequency Noise In Advanced Mos Devices [electronic resource] / by Martin von Haartman, Mikael Östling. - XVI, 216 p. online resource. - Analog Circuits and Signal Processing Series . - Analog Circuits and Signal Processing Series .
Low-Frequency Noise in Advanced CMOS Devices begins with an introduction to noise, describing the fundamental noise sources and basic circuit analysis. The characterization of low-frequency noise is discussed in detail and useful practical advice is given. The various theoretical and compact low-frequency (1/f) noise models in MOS transistors are treated extensively providing an in-depth understanding of the low-frequency noise mechanisms and the potential sources of the noise in MOS transistors. Advanced CMOS technology including nanometer scaled devices, strained Si, SiGe, SOI, high-k gate dielectrics, multiple gates and metal gates are discussed from a low-frequency noise point of view. Some of the most recent publications and conference presentations are included in order to give the very latest view on the topics. The book ends with an introduction to noise in analog/RF circuits and describes how the low-frequency noise can affect these circuits.
9781402059100
10.1007/978-1-4020-5910-0 doi
Engineering.
Microwaves.
Electronics.
Systems engineering.
Engineering.
Electronics and Microelectronics, Instrumentation.
Circuits and Systems.
Physics and Applied Physics in Engineering.
Microwaves, RF and Optical Engineering.
TK7800-8360 TK7874-7874.9
621.381