MARC details
000 -LEADER |
fixed length control field |
03031nam a22004575i 4500 |
001 - CONTROL NUMBER |
control field |
978-94-007-2427-3 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
DE-He213 |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20170628040343.0 |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
fixed length control field |
cr nn 008mamaa |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
131001s2014 ne | s |||| 0|eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
9789400724273 |
-- |
978-94-007-2427-3 |
024 7# - OTHER STANDARD IDENTIFIER |
Standard number or code |
10.1007/978-94-007-2427-3 |
Source of number or code |
doi |
050 #4 - LIBRARY OF CONGRESS CALL NUMBER |
Classification number |
TK7888.4 |
072 #7 - SUBJECT CATEGORY CODE |
Subject category code |
TJFC |
Source |
bicssc |
072 #7 - SUBJECT CATEGORY CODE |
Subject category code |
TEC008010 |
Source |
bisacsh |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
621.3815 |
Edition number |
23 |
100 1# - MAIN ENTRY--PERSONAL NAME |
Personal name |
Neuberger, Gustavo. |
Relator term |
author. |
245 10 - TITLE STATEMENT |
Title |
Protecting Chips Against Hold Time Violations Due to Variability |
Medium |
[electronic resource] / |
Statement of responsibility, etc |
by Gustavo Neuberger, Gilson Wirth, Ricardo Reis. |
264 #1 - |
-- |
Dordrecht : |
-- |
Springer Netherlands : |
-- |
Imprint: Springer, |
-- |
2014. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
XI, 107 p. 76 illus., 51 illus. in color. |
Other physical details |
online resource. |
336 ## - |
-- |
text |
-- |
txt |
-- |
rdacontent |
337 ## - |
-- |
computer |
-- |
c |
-- |
rdamedia |
338 ## - |
-- |
online resource |
-- |
cr |
-- |
rdacarrier |
347 ## - |
-- |
text file |
-- |
PDF |
-- |
rda |
505 0# - FORMATTED CONTENTS NOTE |
Formatted contents note |
Introduction, Process Variations and Flip-Flops -- Process Variability -- Flip-Flops and Hold Time Violations -- Circuits Under Test -- Measurement Circuits -- Experimental Results -- Systematic and Random Variablility -- Normality Tests -- Probability of Hold Time Violations -- Protecting Circuits Against Hold Time Violations -- Padding Efficiency Of the Proposed Padding Algorithm -- Final Remarks. |
520 ## - SUMMARY, ETC. |
Summary, etc |
This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The consequences of variability to several aspects of circuit design, such as logic gates, storage elements, clock distribution, and any other that can be affected by process variations are discussed, with a key focus on storage elements. The authors present a statistical analysis of the critical clock skew in several test paths, due to process variability in 130nm and 90nm CMOS technology. To facilitate an on-wafer test, a measurement circuit with a precision compatible to the speed of the technology is described. · Provides a comprehensive review of various reliability mechanisms; · Describes practical modeling and characterization techniques for reliability · Includes thorough presentation of robust design techniques for major VLSI design units · Promotes physical understanding with first-principle simulations |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Engineering. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Computer science. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Systems engineering. |
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Engineering. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Circuits and Systems. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name as entry element |
Processor Architectures. |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Wirth, Gilson. |
Relator term |
author. |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Reis, Ricardo. |
Relator term |
author. |
710 2# - ADDED ENTRY--CORPORATE NAME |
Corporate name or jurisdiction name as entry element |
SpringerLink (Online service) |
773 0# - HOST ITEM ENTRY |
Title |
Springer eBooks |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY |
Display text |
Printed edition: |
International Standard Book Number |
9789400724266 |
856 40 - ELECTRONIC LOCATION AND ACCESS |
Uniform Resource Identifier |
<a href="http://dx.doi.org/10.1007/978-94-007-2427-3">http://dx.doi.org/10.1007/978-94-007-2427-3</a> |
912 ## - |
-- |
ZDB-2-ENG |