Protecting Chips Against Hold Time Violations Due to Variability (Record no. 28741)

MARC details
000 -LEADER
fixed length control field 03031nam a22004575i 4500
001 - CONTROL NUMBER
control field 978-94-007-2427-3
003 - CONTROL NUMBER IDENTIFIER
control field DE-He213
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20170628040343.0
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr nn 008mamaa
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 131001s2014 ne | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9789400724273
-- 978-94-007-2427-3
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1007/978-94-007-2427-3
Source of number or code doi
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7888.4
072 #7 - SUBJECT CATEGORY CODE
Subject category code TJFC
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC008010
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.3815
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Neuberger, Gustavo.
Relator term author.
245 10 - TITLE STATEMENT
Title Protecting Chips Against Hold Time Violations Due to Variability
Medium [electronic resource] /
Statement of responsibility, etc by Gustavo Neuberger, Gilson Wirth, Ricardo Reis.
264 #1 -
-- Dordrecht :
-- Springer Netherlands :
-- Imprint: Springer,
-- 2014.
300 ## - PHYSICAL DESCRIPTION
Extent XI, 107 p. 76 illus., 51 illus. in color.
Other physical details online resource.
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Introduction, Process Variations and Flip-Flops -- Process Variability -- Flip-Flops and Hold Time Violations -- Circuits Under Test -- Measurement Circuits -- Experimental Results -- Systematic and Random Variablility -- Normality Tests -- Probability of Hold Time Violations -- Protecting Circuits Against Hold Time Violations -- Padding Efficiency Of the Proposed Padding Algorithm -- Final Remarks.
520 ## - SUMMARY, ETC.
Summary, etc This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units.  The consequences of variability to several aspects of circuit design, such as logic gates, storage elements, clock distribution, and any other that can be affected by process variations are discussed, with a key focus on storage elements.  The authors present a statistical analysis of the critical clock skew in several test paths, due to process variability in 130nm and 90nm CMOS technology. To facilitate an on-wafer test, a measurement circuit with a precision compatible to the speed of the technology is described.  ·         Provides a comprehensive review of various reliability mechanisms; ·         Describes practical modeling and characterization techniques for reliability ·         Includes thorough presentation of robust design techniques for major VLSI design units ·         Promotes physical understanding with first-principle simulations
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Computer science.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Systems engineering.
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Engineering.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Circuits and Systems.
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Processor Architectures.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Wirth, Gilson.
Relator term author.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Reis, Ricardo.
Relator term author.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element SpringerLink (Online service)
773 0# - HOST ITEM ENTRY
Title Springer eBooks
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Display text Printed edition:
International Standard Book Number 9789400724266
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="http://dx.doi.org/10.1007/978-94-007-2427-3">http://dx.doi.org/10.1007/978-94-007-2427-3</a>
912 ## -
-- ZDB-2-ENG
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Home library Current library Date acquired Source of acquisition Total Checkouts Barcode Date last seen Price effective from Koha item type
    Dewey Decimal Classification     Central Library Central Library 28/06/2017 Springer EBook   E-51920 28/06/2017 28/06/2017 E-Book

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