Power-Constrained Testing of VLSI Circuits (Record no. 29082)

MARC details
000 -LEADER
fixed length control field 00343nam a2200133 4500
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9781402072352
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.395 NIC
100 ## - MAIN ENTRY--AUTHOR NAME
Personal name Nicolici Nicola
245 ## - TITLE STATEMENT
Title Power-Constrained Testing of VLSI Circuits
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication America
Name of publisher Kluwer Academic Publisher
Year of publication 2003
300 ## - PHYSICAL DESCRIPTION
Number of Pages 178
700 ## - ADDED ENTRY--PERSONAL NAME
Personal name Al-Hashimi Bashir M
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Books
Holdings
Withdrawn status Lost status Home library Current library Shelving location Date acquired Source of acquisition Cost, normal purchase price Serial Enumeration / chronology Full call number Accession Number Koha item type
    Central Library Central Library VLSI 11/07/2017 ALLIED PUBLISHERS PVT LTD BANGALORE 12220.93 2972 621.395 NIC G-94007 Reference
    Central Library Central Library VLSI 11/07/2017 ALLIED PUBLISHERS PVT LTD BANGALORE 6056.20 BAN/CR/005044 621.395 NIC G-4358 Reference
    Central Library Central Library VLSI 11/07/2017 ALLIED PUBLISHERS PVT LTD BANGALORE 12370.88 2815 621.395 NIC G-93881 Reference

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