Amazon cover image
Image from Amazon.com

Testing of Software and Communicating Systems [electronic resource] : 19th IFIP TC6/WG6.1 International Conference, TestCom 2007, 7th International Workshop, FATES 2007, Tallinn, Estonia, June 26-29, 2007. Proceedings / edited by Alexandre Petrenko, Margus Veanes, Jan Tretmans, Wolfgang Grieskamp.

By: Contributor(s): Material type: TextTextSeries: Lecture Notes in Computer Science ; 4581Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2007Description: XII, 379 p. online resourceContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9783540730668
Subject(s): Additional physical formats: Printed edition:: No titleDDC classification:
  • 005.1 23
LOC classification:
  • QA76.758
Online resources:
Contents:
Implementing Conformiq Qtronic -- New Approach for EFSM-Based Passive Testing of Web Services -- Automation of Avionic Systems Testing -- Automatic Test Generation from Interprocedural Specifications -- A New Method for Interoperability Test Generation -- Component Testing Is Not Enough - A Study of Software Faults in Telecom Middleware -- Symbolic Model Based Testing for Component Oriented Systems -- A Compositional Testing Framework Driven by Partial Specifications -- Nodes Self-similarity to Test Wireless Ad Hoc Routing Protocols -- Testing and Model-Checking Techniques for Diagnosis -- Model-Based Testing of Service Infrastructure Components -- Testing Input/Output Partial Order Automata -- A Framework for Testing AIS Implementations -- An Object-Oriented Framework for Improving Software Reuse on Automated Testing of Mobile Phones -- Model Based Testing of an Embedded Session and Transport Protocol -- Utilising Code Smells to Detect Quality Problems in TTCN-3 Test Suites -- A Bounded Incremental Test Generation Algorithm for Finite State Machines -- Experimental Testing of TCP/IP/Ethernet Communication for Automatic Control -- Towards Systematic Signature Testing -- TPLan-A Notation for Expressing Test Purposes -- Testing Nondeterministic Finite State Machines with Respect to the Separability Relation -- Learning and Integration of Parameterized Components Through Testing -- An EFSM-Based Passive Fault Detection Approach -- Test Data Variance as a Test Quality Measure: Exemplified for TTCN-3 -- Model-Based Testing of Optimizing Compilers.
In: Springer eBooks
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Call number Status Date due Barcode
E-Book E-Book Central Library Available E-44377

Implementing Conformiq Qtronic -- New Approach for EFSM-Based Passive Testing of Web Services -- Automation of Avionic Systems Testing -- Automatic Test Generation from Interprocedural Specifications -- A New Method for Interoperability Test Generation -- Component Testing Is Not Enough - A Study of Software Faults in Telecom Middleware -- Symbolic Model Based Testing for Component Oriented Systems -- A Compositional Testing Framework Driven by Partial Specifications -- Nodes Self-similarity to Test Wireless Ad Hoc Routing Protocols -- Testing and Model-Checking Techniques for Diagnosis -- Model-Based Testing of Service Infrastructure Components -- Testing Input/Output Partial Order Automata -- A Framework for Testing AIS Implementations -- An Object-Oriented Framework for Improving Software Reuse on Automated Testing of Mobile Phones -- Model Based Testing of an Embedded Session and Transport Protocol -- Utilising Code Smells to Detect Quality Problems in TTCN-3 Test Suites -- A Bounded Incremental Test Generation Algorithm for Finite State Machines -- Experimental Testing of TCP/IP/Ethernet Communication for Automatic Control -- Towards Systematic Signature Testing -- TPLan-A Notation for Expressing Test Purposes -- Testing Nondeterministic Finite State Machines with Respect to the Separability Relation -- Learning and Integration of Parameterized Components Through Testing -- An EFSM-Based Passive Fault Detection Approach -- Test Data Variance as a Test Quality Measure: Exemplified for TTCN-3 -- Model-Based Testing of Optimizing Compilers.

There are no comments on this title.

to post a comment.

Maintained by VTU Library