VLSI-SoC: Forward-Looking Trends in IC and Systems Design [electronic resource] : 18th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2010, Madrid, Spain, September 27-29, 2010, Revised Selected Papers / edited by José L. Ayala, David Atienza Alonso, Ricardo Reis.

By:

Ayala, José L [editor.]

Contributor(s):

Material type: Text

TextSeries: IFIP Advances in Information and Communication Technology ; 373Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2012Description: X, 358 p. online resourceContent type:

text

Media type:

computer

Carrier type:

online resource

ISBN:

9783642285660

Subject(s):

Additional physical formats: Printed edition:: No titleDDC classification:

005.18 23

LOC classification:

QA76.635

Online resources:

Click here to access online

In: Springer eBooksSummary: This book contains extended and revised versions of the best papers presented at the 18th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2010, held in Madrid, Spain, in September 2010. The 14 papers included in the book were carefully reviewed and selected from the 52 full papers presented at the conference. The papers cover a wide variety of excellence in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of theses systems.

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
E-Book	Central Library		Available		E-48932

This book contains extended and revised versions of the best papers presented at the 18th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2010, held in Madrid, Spain, in September 2010. The 14 papers included in the book were carefully reviewed and selected from the 52 full papers presented at the conference. The papers cover a wide variety of excellence in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of theses systems.

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