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Power -Constrained Testing Of Vlsi Circuits

By: Contributor(s): Material type: TextTextPublication details: America Kluwer Academic Publishers 2003 Description: 178ISBN:
  • 9781441953155
DDC classification:
  • 621.395 NIC
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Holdings
Item type Current library Call number Vol info Status Date due Barcode
Reference Reference Central Library VLSI 621.395 NIC (Browse shelf(Opens below)) 211 Not for loan G-100821
Reference Reference Central Library VLSI 621.395 NIC (Browse shelf(Opens below)) 211 Not for loan G-100822

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