TY - BOOK AU - Lawry,Jonathan ED - SpringerLink (Online service) TI - Modelling and Reasoning with Vague Concepts T2 - Studies in Computational Intelligence, SN - 9780387302621 AV - Q334-342 U1 - 006.3 23 PY - 2006/// CY - Boston, MA PB - Springer US KW - Computer science KW - Artificial intelligence KW - Optical pattern recognition KW - Mathematics KW - Computer Science KW - Artificial Intelligence (incl. Robotics) KW - Systems and Information Theory in Engineering KW - Pattern Recognition KW - Information and Communication, Circuits KW - Probability and Statistics in Computer Science KW - Mathematical Logic and Formal Languages N1 - Vague Concepts and Fuzzy Sets -- Label Semantics -- Multi-Dimensional and Multi-Instance Label Semantics -- Information from Vague Concepts -- Learning Linguistic Models from Data -- Fusing Knowledge and Data -- Non-Additive Appropriateness Measures N2 - Vagueness is central to the flexibility and robustness of natural language descriptions. Vague concepts are robust to the imprecision of our perceptions, while still allowing us to convey useful, and sometimes vital, information. The study of vagueness in Artificial Intelligence (AI) is therefore motivated by the desire to incorporate this robustness and flexibility into intelligent computer systems. Such a goal, however, requires a formal model of vague concepts that will allow us to quantify and manipulate the uncertainty resulting from their use as a means of passing information between autonomous agents. This volume outlines a formal representation framework for modelling and reasoning with vague concepts in Artificial Intelligence. The new calculus has many applications, especially in automated reasoning, learning, data analysis and information fusion. This book gives a rigorous introduction to label semantics theory, illustrated with many examples, and suggests clear operational interpretations of the proposed measures. It also provides a detailed description of how the theory can be applied in data analysis and information fusion based on a range of benchmark problems UR - http://dx.doi.org/10.1007/0-387-30262-X ER -