TY  - BOOK
AU  - Haartman,Martin von
AU  - Östling,Mikael
ED  - SpringerLink (Online service)
TI  - Low-Frequency Noise In Advanced Mos Devices
T2  - Analog Circuits and Signal Processing Series
SN  - 9781402059100
AV  - TK7800-8360 
U1  - 621.381 23
PY  - 2007///
CY  - Dordrecht
PB  - Springer Netherlands
KW  - Engineering
KW  - Microwaves
KW  - Electronics
KW  - Systems engineering
KW  - Electronics and Microelectronics, Instrumentation
KW  - Circuits and Systems
KW  - Physics and Applied Physics in Engineering
KW  - Microwaves, RF and Optical Engineering
N2  - Low-Frequency Noise in Advanced CMOS Devices begins with an introduction to noise, describing the fundamental noise sources and basic circuit analysis. The characterization of low-frequency noise is discussed in detail and useful practical advice is given. The various theoretical and compact low-frequency (1/f) noise models in MOS transistors are treated extensively providing an in-depth understanding of the low-frequency noise mechanisms and the potential sources of the noise in MOS transistors. Advanced CMOS technology including nanometer scaled devices, strained Si, SiGe, SOI, high-k gate dielectrics, multiple gates and metal gates are discussed from a low-frequency noise point of view. Some of the most recent publications and conference presentations are included in order to give the very latest view on the topics. The book ends with an introduction to noise in analog/RF circuits and describes how the low-frequency noise can affect these circuits
UR  - http://dx.doi.org/10.1007/978-1-4020-5910-0
ER  -