TY  - BOOK
AU  - Liu,Xiao
AU  - Xu,Qiang
ED  - SpringerLink (Online service)
TI  - Trace-Based Post-Silicon Validation for VLSI Circuits
T2  - Lecture Notes in Electrical Engineering,
SN  - 9783319005331
AV  - TK7888.4 
U1  - 621.3815 23
PY  - 2014///
CY  - Heidelberg
PB  - Springer International Publishing, Imprint: Springer
KW  - Engineering
KW  - Computer science
KW  - Systems engineering
KW  - Circuits and Systems
KW  - Processor Architectures
KW  - Semiconductors
N1  - Introduction -- State of the Art on Post-Silicon Validation -- Signal Selection for Visibility Enhancement -- Multiplexed Tracing for Design Error -- Tracing for Electrical Error -- Reusing Test Access Mechanisms -- Interconnection Fabric for Flexible Tracing -- Interconnection Fabric for Systematic Tracing -- Conclusion
N2  - This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits.  The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective.  A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices. ·         Provides a comprehensive summary of state-of-the-art on post-silicon validation; ·         Offers automated solutions that are systematic and cost-effective for post-silicon validation, from trace signal selection to trace data transfer; ·         Illustrate key concepts and algorithms with real examples.        
UR  - http://dx.doi.org/10.1007/978-3-319-00533-1
ER  -