Built-in-Self-Test and Digital Self-Calibration for RF SoCs [electronic resource] / by Sleiman Bou-Sleiman, Mohammed Ismail.
Material type: TextSeries: SpringerBriefs in Electrical and Computer EngineeringPublisher: New York, NY : Springer New York, 2012Description: XVII, 89p. 70 illus. online resourceContent type:- text
- computer
- online resource
- 9781441995483
- 621.3815 23
- TK7888.4
Item type | Current library | Call number | Status | Date due | Barcode | |
---|---|---|---|---|---|---|
E-Book | Central Library | Available | E-39143 |
Introduction and Motivation -- Radio Systems Overview: Architecture, Performance and Built-in-Test -- Efficient Testing for RF SoCs -- RF Built-in-Self-Test -- RF Built-in-Self-Calibration -- Conclusions.
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
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