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	1.	Power-Aware Testing and Test Strategies for Low Power Devices [electronic resource] / edited by Patrick Girard, Nicola Nicolici, Xiaoqing Wen. by Girard, Patrick [editor.] Nicolici, Nicola [editor.] Wen, Xiaoqing [editor.] SpringerLink (Online service) Material type: Text; Format: electronic available online ; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2010 In: Springer eBooks Online resources: Click here to access online Availability: Items available for loan: Central Library (1). Place hold
	2.	Advanced Test Methods for SRAMs [electronic resource] : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies / by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel. by Bosio, Alberto [author.] Dilillo, Luigi [author.] Girard, Patrick [author.] Pravossoudovitch, Serge [author.] Virazel, Arnaud [author.] SpringerLink (Online service) Edition: 1. Material type: Text; Format: electronic available online ; Literary form: Not fiction Publisher: Boston, MA : Springer US, 2010 In: Springer eBooks Online resources: Click here to access online Availability: Items available for loan: Central Library (1). Place hold

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