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1.
Thermal and Power Management of Integrated Circuits [electronic resource] / by Arman Vassighi, Manoj Sachdev. by Series: Series on Integrated Circuits and Systems
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publisher: Boston, MA : Springer US, 2006 In: Springer eBooks
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Availability: Items available for loan: Central Library (1).

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2.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits [electronic resource] : 2nd Edition / edited by Manoj Sachdev, José Pineda de Gyvez. by Series: Frontiers in Electronic Testing ; 34
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publisher: Boston, MA : Springer US, 2007 In: Springer eBooks
Online resources:
Availability: Items available for loan: Central Library (1). Items available for reference: Central Library: Not for loan (1)Call number: 621.395 SAC.

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3.
ESD Protection Device and Circuit Design for Advanced CMOS Technologies [electronic resource] / by Oleg Semenov, Hossein Sarbishaei, Manoj Sachdev. by
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publisher: Dordrecht : Springer Netherlands, 2008 In: Springer eBooks
Online resources:
Availability: Items available for loan: Central Library (1).

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4.
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies [electronic resource] : Process-Aware SRAM Design and Test / by Andrei Pavlov, Manoj Sachdev. by Series: Frontiers In Electronic Testing ; 40
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publisher: Dordrecht : Springer Netherlands, 2008 In: Springer eBooks
Online resources:
Availability: Items available for loan: Central Library (1).

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