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1.
VLSI Test Principles and Architectures Design For Testability by
Material type: Text Text
Publication details: New Delhi Elsevier 2011
Availability: Items available for loan: Central Library (2)Call number: 621.395 WAN, ... Items available for reference: Central Library: Not for loan (2)Call number: 621.395 WAN, ...

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Power-Aware Testing and Test Strategies for Low Power Devices [electronic resource] / edited by Patrick Girard, Nicola Nicolici, Xiaoqing Wen. by
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publisher: Boston, MA : Springer US, 2010 In: Springer eBooks
Online resources:
Availability: Items available for loan: Central Library (1).

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