Power-Constrained Testing of VLSI Circuits
Material type: TextPublication details: America Kluwer Academic Publisher 2003 Description: 178ISBN:- 9781402072352
- 621.395 NIC
Item type | Current library | Call number | Vol info | Status | Date due | Barcode | |
---|---|---|---|---|---|---|---|
Reference | Central Library VLSI | 621.395 NIC (Browse shelf(Opens below)) | 2815 | Not for loan | G-93881 | ||
Reference | Central Library VLSI | 621.395 NIC (Browse shelf(Opens below)) | 2972 | Not for loan | G-94007 | ||
Reference | Central Library VLSI | 621.395 NIC (Browse shelf(Opens below)) | BAN/CR/005044 | Not for loan | G-4358 |
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621.395 NIC Power -Constrained Testing Of Vlsi Circuits | 621.395 NIC Power -Constrained Testing Of Vlsi Circuits | 621.395 NIC Power-Constrained Testing of VLSI Circuits | 621.395 NIC Power-Constrained Testing of VLSI Circuits | 621.395 NIC Power-Constrained Testing of VLSI Circuits | 621.395 PAL CMOS Current Amplifiers | 621.395 PAR VLSI DIGITAL SINGNAL PROCESSING SYSTEMS : Design and Implementation |
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