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1.
Power-Aware Testing and Test Strategies for Low Power Devices [electronic resource] / edited by Patrick Girard, Nicola Nicolici, Xiaoqing Wen. by
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publisher: Boston, MA : Springer US, 2010 In: Springer eBooks
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Availability: Items available for loan: Central Library (1).

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2.
Power -Constrained Testing Of Vlsi Circuits by
Material type: Text Text
Publication details: America Kluwer Academic Publishers 2003
Availability: Items available for reference: Central Library: Not for loan (2)Call number: 621.395 NIC, ...

3.
Power-Constrained Testing of VLSI Circuits by
Material type: Text Text
Publication details: America Kluwer Academic Publisher 2003
Availability: Items available for reference: Central Library: Not for loan (3)Call number: 621.395 NIC, ...

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